Many analog circuit design and test problems can be boiled down to telling a difference between two analog circuits or responses. For instance: "is this design better than that one?" or "does this IC sample have a defect?". In fact, the difficulties in optimizing analog circuits or measuring the fault coverage of analog tests can be attributed to the fact that it is hard to tell whether two continuous analog quantities are the same or different, especially if circuit variation or simulation/measurement noise is present. This talk demonstrates that addressing this problem directly can lead to much simpler solutions to the circuit optimization and test coverage problems in analog. For example, the number of candidates to consider from a continuous design space can be finite; the digital mode bits of a mixed-signal circuit does not need to be exhaustively tried during production screening. The talk will outline the current research directions and present some promising results from the early experiments.
Jaeha Kim is currently Assistant Professor at Seoul National University and his research interests include low-power mixed-signal systems and their design methodologies. He received the B.S. degree in electrical engineering from Seoul National University in 1997, and received the M.S. and Ph.D. degrees in electrical engineering from Stanford University in 1999 and 2003, respectively.
Prior to joining Seoul National University in 2010, he was with Stanford University, CA as Acting Assistant Professor from 2009 to 2010, with Rambus, Inc., Los Altos, CA as Principal Engineer from 2006 to 2009, and with Inter-university Semiconductor Research Center (ISRC) in Seoul National University, Seoul, Korea as Post-doctoral Researcher from 2003 to 2006. From 2001 to 2003, he was with True Circuits, Inc., Los Altos, CA as Circuit Designer.
Dr. Kim is a recipient of the Takuo Sugano award for outstanding far-east paper at 2005 International Solid-State Circuits Conference (ISSCC) and the Low Power Design Contest Award at 2001 International Symposium on Low Power Electronics and Design (ISLPED). He served on the technical program committees of Design Automation Conference (DAC), International Conference on Computer Aided Design (ICCAD), and Asian Solid-State Circuit Conference (A-SSCC). He is currently a Distinguished ACM Speaker in the area of design automation.