Ph.D., Analytical Chemistry, University of North Carolina, 1988
Research Chemist, Gas and Particulate Science Division, Center
for Analytical Chemistry, National Institute of Standards and
Technology, 1983-1988
Postdoctoral Research Associate, Department of Materials Science
and Engineering and Precision Engineering Center, North Carolina
State University, 1988-1991
Visiting Lecturer, Department of Chemistry, University of North Carolina,
1991-1992
Fields of Research Specialization
Surface and Microbeam Analysis
Laser Microprobe Mass Spectrometry
Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy
(AFM): Tip Fabrication, Image Contrast Mechanisms, Limits of Image
Contrast Resolution, Application to Polymer Surface Microstructure
Fields of Teaching Specialization
Surface and Microbeam Analysis
Analytical Chemistry
General Chemistry
Industrial and Government Interactions
1988-1991 Collaborated with Hoechst Celanese Research Division, Summit,
NJ to address the role of scanning probe microscopy for polymer
surface characterization. Explored ultrastructures of liquid
crystalline polymers (LCP) and extended the LCP structure model.
1982-1988 Conducted Ph.D. research in the Microanalysis Group, National
Institute of Standards and Technology, Gaithersburg, MD.
Addressed molecular and quantitative aspects of laser microprobe
mass spectrometry for inorganic particle analysis.
Patents
"Scanning Tunneling Microscope Tips", U.S. Patent 5,164,595, awarded
November 17, 1992; assigned to North Carolina State University.
"Method of Fabricating Scanning Tunneling Microscope Tips", U. S.
Patent 5,085,746, awarded February 4, 1992; assigned to North Carolina
State University.
Research Goals and Description of Research Interests
My research objectives address two aspects of scanning probe
microscopy (SPM). The first objective concerns the investigation of image
contrast mechanisms, limits of image contrast resolution, and causes of
molecular alignment on surfaces. Initial image contrast studies are
directed at determining the extent to which similar atoms may be
differentiated by contrast in STM and AFM images. The second objective
concerns the application of SPM to the study of polymer surface
microstructure. Microstructural analyses by SPM are being conducted
for polypeptide molecules, for Langmuir-Blodgett polypeptide thin films
which may prove to be an effective medium for advances in (opto-)
electronic devices, for conducting polymer membranes for the separation
of gases important to coal and energy technology, and for paired helical
filaments which constitute the neurofibrillary tangles and senile plaques
of Alzheimer diseased brains.
Representative Papers
I.H. Musselman and P.E. Russell, "Platinum / Iridium Tips with
Controlled Geometry for Scanning Tunneling Microscopy", J. Vac. Sci.
Technol. A, 8(4), 3558 (1990). I.H. Musselman, L. C. Sawyer, R. T. Chen, M. G. Jamieson, and P. E.
Russell, "The Fibrillar Hierarchy in Liquid Crystalline Polymers", J. Mat.
Sci., 28(1), 225 (1993). I.H. Musselman, K. H. Gray, R. M. Leasure, T. J. Meyer, and R. W.
Linton, "Scanning Probe Microscopy and Sputter Depth Profiling of
Conductive Polymer Thin Films", Microbeam Analysis, 2, 297 (1993). I.H. Musselman, D. L. Smith, E. P. Enriquez, V. F. Guarisco, and E. T.
Samulski, "Effects of Substrate on Ultra-Thin Films of Poly(g-Benzyl-L-
Glutamate) by Scanning Probe Microscopy", J. Vac. Sci. Technol. A, 12(4), Back to Chemistry Home Page
Last modified 10 April 1998