Power Electronics Reliability, Control and Circuits Papers:

 

 

[*] Farhadi, M., Vankayalapati B., Sajadi, A., Akin, B. “AC Power Cycling Test Setup and Condition Monitoring Tools for SiC-Based Traction Inverters”
IEEE Transactions on Vehicular Technology, https://ieeexplore.ieee.org/abstract/document/10113180

 

[*] Farhadi, M., Vankayalapati B., Sajadi, A., Akin, B. “Gate-Oxide Degradation Monitoring of SiC MOSFETs Based on Transfer Characteristics with Temperature Compensation”
IEEE Transactions on Transportation of Electrification, https://ieeexplore.ieee.org/document/10097582
 

[*] Vankalayapati B. , Farhadi, M., Sajadi, A., Akin, B. "A Practical Switch Condition Monitoring Solution for SiC Traction Inverters"

IEEE Journal of Emerging and Selected Topics in Power Electronics, https://ieeexplore.ieee.org/document/9930745

 

[*] Farhadi, M., Vankayalapati B., A., Akin, B. “Reliability Evaluation of SiC MOSFETs Under Realistic Power Cycling Tests”
IEEE Power Electronics Magazine,  https://ieeexplore.ieee.org/document/10167542

 

[*] Xu C.,  Vankalayapati B. , Yang F., Akin, B. "A Reconfigurable AC Power Cycling Test Setup for Comprehensive Reliability Evaluation of GaN HEMTs"

IEEE Transactions on Industry Applications, https://ieeexplore.ieee.org/document/9932014

 

[*] Kumar, S., S. Voruganti, Gohil, G., B., Akin, "Common-mode Current Analysis and Cancellation Technique for Dual Active Bridge Converter based DC System", 

IEEE Transactions on Industry Applications, https://ieeexplore.ieee.org/document/9772264

 

[*] Pu, S., Yang, F., Zhang, N., Vankalayapati, Akin, B. “A Comparative Study on Reliability and Ruggedness of Kelvin and non-Kelvin Packaged SiC MOSFETs”,

IEEE Transactions on Industry Applications, https://ieeexplore.ieee.org/document/9739955 (Prize Paper Award - 1st Place)

 

[*] Vankalayapati, B, Pu, S., Yang, F., Farhadi, M., Gurusamy, V., Akin, B. "Investigation and On-Board Detection of Gate-Open Failure in SiC MOSFETs",

IEEE Transactions on Power Electronics, https://ieeexplore.ieee.org/document/9601245

 

[*] Pu, S., Yang, F., Vankalayapati, B, Akin, B. "Aging Mechanisms and Accelerated Lifetime Tests for SiC MOSFETs",

IEEE Journal of Emerging and Selected Topics in Power Electronics, https://ieeexplore.ieee.org/document/9529341 (Prize Paper Award - 2nd Place)

 

[*] Kumar, S., Gohil, G., B., Akin, "EMI Performance of Active Neutral Point Clamped Phase Leg for Dual Active Bridge DC-DC Converter",

IEEE Transactions on Industry Applications,https://ieeexplore.ieee.org/document/9507315

 

[*] Vankalayapati, B, Yang, F., Pu, S., Farhadi, M., Akin, B. "A Highly Scalable, Modular Test Bench Architecture for Large-Scale DC Power Cycling of SiC MOSFETs: Towards Data Enabled Reliability ",

IEEE Power Electronics Magazine, https://ieeexplore.ieee.org/document/9359913

 

[*] Farhadi, M., Yang, F., Pu, S., Vankalayapati, B, Akin, B. "Temperature Independent Gate Oxide Degradation Monitoring of SiC MOSFETs Based on Junction Capacitances",

IEEE Transactions on Power Electronics, https://ieeexplore.ieee.org/document/9314094

 

[*] Zhao, S., Peng, Y., Yang, F.,Ugur, E., Wang, H., Akin, B. "Health State Estimation and Remaining Useful Life Prediction of Power Devices Subject to Noisy and  

 Aperiodic Condition Monitoring"

IEEE Transactions on Instrumentation & Measurement, https://ieeexplore.ieee.org/document/9335597

 

[*] Yang, F., Pu, S., Xu, C., Akin, B. "Turn-on Delay Based Real-Time Junction Temperature Measurement for SiC MOSFETs with Aging Compensation",

IEEE Transactions on Power Electronics, https://ieeexplore.ieee.org/document/9140407

 

[*] Xu, C., Yang, F., Ramadass, Y., Akin, B. "Performance Degradation of Automotive Power MOSFETs under Repetitive Avalanche Breakdown Test",

IEEE Transactions on Transportation Electrification, https://ieeexplore.ieee.org/document/9139994

 

[*] Zhao, S., Chen, S., Yang, F.,Ugur, E., Xu, C., Wang, H., Akin, B. "A Composite Failure Precursor for Condition Monitoring and Remaining Useful Life Prediction of Discrete Power Devices",

IEEE Transactions on Industrial Informatics, https://ieeexplore.ieee.org/document/9082880

 

[*] Pu, S., Yang, F.,Vankayalapati,B., Ugur, E., Xu, C., B., Akin,B. "A Practical On-board SiC MOSFET Condition Monitoring Technique for Aging Detection",

IEEE Transactions on Industry Applications, https://ieeexplore.ieee.org/document/9034080

 

[*] Yang, F., Xu, C., Akin, B. "Characterization of Threshold Voltage Instability Under Off-State Drain Stress and its Impact on p-GaN HEMT Performance"

IEEE Journal of Emerging and Selected Topics in Power Electronics, https://ieeexplore.ieee.org/document/8974264

 

[*] Ugur,E., Yang, F., Pu,S., Xu, C., Akin, B. "A New Complete Condition Monitoring Method for SiC Power MOSFETs"

IEEE Transactions on Industrial Electronics, https://ieeexplore.ieee.org/document/8984739

 

[*] Li, K.,Cheng, S., Yu, T., Wu, X., Xiang, C.; Akin, B. “An On-Line Multiple Open-Circuit Fault Diagnostic Technique for Railway Vehicle Air-Conditioning Inverters”
IEEE Transactions on Vehicular Technology, https://ieeexplore.ieee.org/document/9069454

 

[*] Yang, F., Ugur,E., Akin, B. "Evaluation of Aging’s Effect on Temperature Sensitive Electrical Parameters in SiC MOSFETs"

IEEE Transactions on Power Electronics, https://ieeexplore.ieee.org/document/8886393

 

[*] Pu,S., Ugur,E., Yang, F., Wang, G., Akin, B. "In-situ Degradation Monitoring of SiC MOSFET Based on Switching Transient Measurement"

IEEE Transactions on Industrial Electronics, https://ieeexplore.ieee.org/document/8755335

[*] Yang, F., Ugur, E., Akin, B., “Design Methodology of DC Power Cycling Test Setup for SiC MOSFETs”
IEEE Journal of Emerging and Selected Topics in Power Electronics, https://ieeexplore.ieee.org/document/8703805

 

[*] Yang, F., Xu, C., Bahl, S., Akin, B. "Experimental Evaluation and Analysis of Switching Transient’s Effect on Dynamic On-Resistance in GaN HEMTs"

IEEE Transaction on Power Electronics, https://ieeexplore.ieee.org/document/8601347.

 

[*] Ugur, E.,Yang, F., Pu, S., Zhao, S., Akin, B., "Degradation Assessment and Precursor Identification for SiC MOSFETs under High Temp Cycling",

IEEE Transactions on Industry Applications, https://ieeexplore.ieee.org/document/8603754

 

[*] Xu, C., Yang, F., Ugur, E., Pu, S., and Akin, B.," Performance Degradation of GaN HEMTs under Accelerated Power Cycling Tests”
CPSS / IEEE Transactions on Power Electronics and Applications, https://ieeexplore.ieee.org/document/8636440

 

[*] Ugur, E., Dusmez, S., and Akin, B.," An Investigation on Diagnosis Based Power Switch Lifetime Extension Strategies for Three-Phase Inverters”
IEEE Transactions on Industry Applications, https://ieeexplore.ieee.org/document/8515087 (Prize Paper Award - 2nd Place)

 

[*] Ali S., Ugur, E., and Akin, B.," Analysis of Vth Variations in IGBTs Under Thermal Stress for Improved Condition Monitoring in Automotive Power Conversion Systems”
IEEE Transactions on Vehicular Technology, https://ieeexplore.ieee.org/document/8532311

 

[*] Ali, S., Li, X, Kamath A., and Akin, B. "A Simple Plug-in Circuit for IGBT Gate Drivers to Monitor Device Aging",

IEEE Power Electronics Magazine, https://ieeexplore.ieee.org/document/8458387

 

[*] F. Erturk, Ugur, E., and B. Akin," Real-Time Ageing Detection of SiC Mosfets”
IEEE Transactions on Industry Applications, https://ieeexplore.ieee.org/document/8450023

[*] M. Bhardwaj, S.Choudhury, B. Akin,"Auto Injection Control for In-circuit Frequency Response Measurement"
IEEE Transactions on Industrial Electronics, http://ieeexplore.ieee.org/document/8106652/


[*] Ali, S., Heydarzadeh M., Dusmez S. Li, X, Kamath A., and Akin, B. "Lifetime Estimation of Discrete IGBT Devices Based on Gaussian Processs"
IEEE Transactions on Industry Applications, 
http://ieeexplore.ieee.org/document/8039225/

 

[*] Dusmez, S., Ali, Heydarzadeh M., S.H, Kamath, A., Duran, H. and Akin, B. "Aging Precursor Identification and Lifetime Estimation for Thermally Aged Discrete Package Silicon Power Switches"
IEEE Transactions on Industry Applications, 
http://ieeexplore.ieee.org/document/7552489/ (Prize Paper Award - 1st Place)


[*] Dusmez, S., Ali, Heydarzadeh M., M. Nourani, and Akin, B. "Remaining Useful Lifetime Estimation for Power MOSFETs Under Thermal Stress With RANSAC Outlier Removal"
IEEE Transactions on Industrial Informatics,
http://ieeexplore.ieee.org/document/7847346/


[*] M. Bhardwaj, S.Choudhury, R. Poley, B. Akin,"Online Frequency Response Analysis: A Powerful Plug-in Tool for Compensation Design and Health Assesment of Power Converters"
IEEE Transactions on Industry Applications, 
http://ieeexplore.ieee.org/document/7394160/


[*] Dusmez, S., Akin, B. "An Active Life Extension Strategy for Thermally Aged Power Switches Based on Pulse-Width Adjustment Method in Interleaved Converters"
IEEE Transactions on Power Electronics, 
http://ieeexplore.ieee.org/document/7289459/


[*] Dusmez, S., M. Bhardwaj, Lei, S., B.Akin, "In-Situ Condition Monitoring of High-Voltage Discrete Power MOSFET in Boost Converter through Software Frequency Response Analysis"
IEEE Transactions on Industrial Electronics, 
http://ieeexplore.ieee.org/document/7524690/


[*] Dusmez, S., Akin, B. "Remaining Useful Lifetime Estimation For Thermally Stressed Power FETs Based on On-State Resistance Variation"
IEEE Transactions on Industry Applications, 
http://ieeexplore.ieee.org/document/7383283/


[*] Li, X.,Dusmez, S., Akin, B., Rajashekara, K. "Vector based dead-time compensation for three-level T-type converters",
IEEE Transactions on Industry Applications, 
http://ieeexplore.ieee.org/document/7294710/


[*] Vardhan, H., Akin, B., Jin, H. "A Low-Cost High-Fidelity Processor-in-the Loop Platform for Rapid Prototyping of Power Electronics Circuits and Motor Drives",
IEEE Power Electronics Magazine, 
http://ieeexplore.ieee.org/document/7497546/


[*] X. Li, S. Dusmez, B. Akin, and K. Rajashekara, “A New SVPWM for the Phase Current Reconstruction of Three-Phase Three-Level T-type Converters,”
IEEE Transactions on Power Electronics, 
http://ieeexplore.ieee.org/document/7116562/


[*]S. Dusmez, X. Li, and B. Akin, “A New Multi-Input Three-Level DC/DC Converter,”
IEEE Transactions on Power Electronics, 
http://ieeexplore.ieee.org/document/7088646/


[*] Dusmez, S.; Li, X., M.; Akin, B. "A Fully Integrated Three-Level Isolated Single Stage PFC Converter",
IEEE Transactions on Power Electronics, 
http://ieeexplore.ieee.org/document/6818440/


[*] Dusmez, S.; Ling, Q., M.; Akin, B. "A New SVPWM Modulation Technique For DC Negative Rail Current Sensing At Low Speeds",
IEEE Transactions on Industrial Electronics, 
http://ieeexplore.ieee.org/document/6850022/


[*] Li, X., Akin, B., Rajashekara, K. “A New Active Fault Tolerant SVPWM Strategy for Single Phase Faults in Three-Phase Multilevel Converters",
IEEE Transactions on Industrial Electronics, 
http://ieeexplore.ieee.org/document/6933932/?arnumber=6933932


[*] Dusmez, S.; Choudhury, S.; Bhardwaj, M.; Akin, B. "A Modified Dual Output Interleaved PFC Converter Using Single Negative Rail Current Sense for Server Power Systems",
IEEE Transactions on Power Electronics, 
http://ieeexplore.ieee.org/document/6804690/


[*] Li, X., Dusmez, S., Rajagopal, P., Akin, B., Kaushik, R., "A New SVPWM Modulated Input Switched Multilevel Converter For Grid-Connected PV Energy Generation Systems"
IEEE Transactions on Emerging and Selected Topics in Power Electronics, 
http://ieeexplore.ieee.org/document/6901189/


[*] Vural, B.; Dusmez, S.; Uzunoglu, M.; Ugur, E.; Akin, B. "Fuel Consumption Comparison of Different Battery/Ultracapacitor Hybridization Topologies for Fuel-Cell Vehicles on a Test Bench",
IEEE Transactions on Emerging and Selected Topics in Power Electronics, 
http://ieeexplore.ieee.org/document/6701339/


[*] Akin, B.; Bhardwaj, M.; Choudhury, S., "An Integrated Implementation of Two-Phase Interleaved PFC and Dual Motor Drive Using Single MCU With CLA,"
IEEE Transactions on Industrial Informatics, 
http://ieeexplore.ieee.org/document/6377297/


[*] Rajashekara, K.; Akin, B., "Cryogenic Power Conversion Systems: The next step in the evolution of power electronics technology.,"
IEEE Electrification Magazine, 
http://ieeexplore.ieee.org/document/6749061/


CONFERENCE PAPERS:

 

[*] F. Yang, S. Pu, G. Wang, S. Butler, and B. Akin, "Package Degradation's Impact on SiC MOSFETs Loss: A Comparison of Kelvin and Non-Kelvin Designs"
in Proc. IEEE APEC, Virtual Conference, 2021

 

[*] S. Pu, F. Yang and B. Akin, "Active Channel Impact on SiC MOSFET Gate Oxide Reliability"
in Proc. IEEE APEC, Virtual Conference, 2021

 

[*] Ehya, H., Nysveen, A., Antonino-Daviu, J. and Akin, B. " Inter-turn Short Circuit Fault Identification of Salient Pole Synchronous Generators by Descriptive Paradigm"
in Proc. IEEE ECCE, Vancouver, Canada, 2021.

[*] N. Zhang, S. Pu, and B. Akin, "An Automated Multi-Device Characterization System for Reliability Assessment of Power Semiconductors"
in Proc. IEEE Sdemped, Virtual Conference, 2021

[*] Chi Xu, Fei Yang, and B. Akin, "Design of AC Power Cycling Test Setup for GaN HEMTs’ Reliability Assessments"
in Proc. IEEE Sdemped, Virtual Conference, 2021

[*] C. Li, B. Vankayalapati, and B. Akin, " Latency Compensation of SD-ADC for High Performance Motor Control and Diagnosis"
in Proc. IEEE Sdemped, Virtual Conference, 2021

[*] B. Vankayalapati, and B. Akin, " Closed-loop Junction Temperature Control of SiC MOSFETs in DC Power Cycling for Accurate Reliability Assessments"
in Proc. IEEE Sdemped, Virtual Conference, 2021

 

[*] Yang, F. and Akin, B. "Evaluation of Aging's Effect on the Switching Loss Variation in SiC MOSFETs"
in Proc. IEEE ECCE, Maryland,MD, 2019, https://ieeexplore.ieee.org/document/8912284


[*] Xu, C. Yang F., Ramadass Y. and Akin, B. "Investigation of Performance Degradation in Laterally Diffused MOSFET under OFF-State Avalanche Breakdown Test"
in Proc. IEEE ECCE, Maryland,MD, 2019, https://ieeexplore.ieee.org/document/8913030

 

[*] S. Pu, F. Yang, E. Ugur, “SiC MOSFET Aging Detection based on Miller Plateau Voltage Sensing”
In Proc. IEEE ITEC, MI, 2019, https://ieeexplore.ieee.org/document/8790553

[*] S. Pu, F. Yang, E. Ugur, “On-board SiC MOSFET Degradation Monitoring through Readily Available System Current / Voltage Sensing”
In Proc. IEEE ITEC, MI, 2019, https://ieeexplore.ieee.org/document/8790611

[*] F. Yang, C., Xu, B. Akin, “Impact of Threshold Voltage Instability on Static and Switching Performance of GaN Devices with p-GaN Gate”
In Proc. IEEE APEC, CA, 2019, https://ieeexplore.ieee.org/document/8722163


[*] F. Yang, E. Ugur, B. Akin, “Design of a High-Performance DC Power Cycling Test Setup for SiC MOSFETs Based on Switching Transient Analysis”
In Proc. IEEE APEC, CA, 2019 https://ieeexplore.ieee.org/document/8721974

 

[*] S. Pu, E, Ugur, F. Yang, C. Xu, B. Akin, “Thermally Triggered SiC MOSFET Aging Effect on Conducted EMI”
In Proc. IEEE WIPDA, Atlanta, https://ieeexplore.ieee.org/document/8569184

[*] C. Xu, E. Ugur, F. Yang B. Akin, “Investigation of Performance Degradation in Enhancement-Mode GaN HEMTs under Accelerated Aging”
In Proc. IEEE WIPDA, Atlanta, https://ieeexplore.ieee.org/document/8569040


[*] F. Yang, C. Xu, B. Akin, “Investigation of EM Radiation Changes in SiC Based Converters Throughout Device Aging”
In Proc. IEEE WIPDA,Atlanta https://ieeexplore.ieee.org/document/8170545

[*] Yang, F.,B. Akin., “Design of a Fast Dynamic on-Resistance Measurement Circuit for GaN Power HEMTs”
In Proc. IEEE ITEC, https://ieeexplore.ieee.org/document/8450093

[*] Heydarzadeh, M., Baruti, K., B. Akin., “Dictionary Learning for Bearing Fault Diagnosis”
In Proc. IEEE ITEC, https://ieeexplore.ieee.org/document/8450165

 

[*] S. Pu, E, Ugur, B. Akin, “Investigation of EM Radiation Changes in SiC Based Converters Throughout Device Aging”
In Proc. IEEE WIPDA, New Mexico, http://ieeexplore.ieee.org/document/8170545/


[*] C. Xu, E, Ugur, B. Akin, “Investigation of Performance Degradation in Thermally Aged Cascode GaN Power Devices”
In Proc. IEEE WIPDA, New Mexico, http://ieeexplore.ieee.org/document/8170522/


[*] S. Pu, E, Ugur, B. Akin, “Real-Time Degradation Monitoring of SiC-MOSFETs Through Readily Available System Microcontroller”
In Proc. IEEE WIPDA, New Mexico, http://ieeexplore.ieee.org/document/8170576/


[*] E. Ugur and B. Akin, "Aging Assessment of Discrete SiC MOSFETs under High Temperature Cycling Tests"
in Proc. IEEE ECCE, Cincinnati, OH, http://ieeexplore.ieee.org/document/8096624/


[*] F. Erturk and B. Akin, "A Method for Online Ageing Detection in SiC MOSFETs"
in Proc. IEEE APEC, Tampa, FL, http://ieeexplore.ieee.org/document/7931211/


[*] M. Heydarzadeh, S. Dusmez,M. Nourani and B. Akin, "Bayesian Remaining Useful Lifetime Prediction of Thermally Aged Power MOSFETs"
in Proc. IEEE APEC, Tampa, FL, http://ieeexplore.ieee.org/document/7931083/


[*] S. Dusmez, M. Heydarzadeh, M. Nourani and B. Akin, "Remaining Useful Lifetime Estimation For Thermally Aged Power Mosfets With Ransac Denoising Algorithm"
in Proc. IEEE ECCE, Milwaukee, WI, http://ieeexplore.ieee.org/document/7847346/


[*] S.H. Ali, S. Dusmez, and B. Akin, "Investigation of Collector Emitter Voltage Characteristics in Thermally Stressed Discrete IGBT Devices for Early Warning Systems"
in Proc. IEEE ECCE, Milwaukee, WI, http://ieeexplore.ieee.org/document/7855216/


[*] S.H. Ali, S. Dusmez, and B. Akin, "A Comprehensive Study on Variations of Discrete IGBT Characteristics Due To Degradation Triggered By Thermal Stress"
in Proc. IEEE ECCE, Milwaukee, WI, http://ieeexplore.ieee.org/document/7854665/


[*] S. Dusmez, E. Ugur and B. Akin, “Power Switch Lifetime Extension Strategies for Three-Phase Converters”,
in Proc. IEEE APEC, Long Beach, CA, http://ieeexplore.ieee.org/document/7468018/


[*] S. Dusmez, and B. Akin, “Comprehensive Parametric Analyses of Thermally Aged Power MOSFETs for Failure Precursor Identification and Lifetime Estimation Based on Gate Threshold Voltage"
in Proc. IEEE APEC, Long Beach, CA, http://ieeexplore.ieee.org/document/7468158/


[*] S. Dusmez, M. Bhardwaj, L. Sun and B. Akin, “A Software Frequency Response Analysis Method to Monitor Degradation of Power MOSFETs in Basic Single-Switch Converters ”,
in Proc. IEEE APEC, Long Beach, CA, http://ieeexplore.ieee.org/document/7467919/


[*] S. Dusmez, and B. Akin, “Remaining Useful Lifetime Estimation For Degraded Power MOSFETs Under Cyclic Thermal Stress”,
in Proc. IEEE ECCE, Montreal, CA, http://ieeexplore.ieee.org/document/7310203/


[*] S. Dusmez, A. S. Huzaif and B. Akin, “An Active Life Extension Strategy for Power Switches in Interleaved Converters”,
in Proc. IEEE IAS Annual Meeting of Ind. Appl. Society. , Dallas, Texas, USA, (Best Paper Award), http://ieeexplore.ieee.org/document/7356828/


[*] S. Dusmez, and B. Akin, “An Accelerated Thermal Aging Platform to Monitor Fault Precursor On-State Resistance”,
in Proc. IEEE IEMDC, Coeur d’Alène, Idaho, USA, http://ieeexplore.ieee.org/document/7409238/


[*] S. Dusmez, X. Li, and B. Akin, “A new multi-input three-level DC/DC converter for renewable energy systems”,
in Proc. IEEE APEC Annu. Meeting, Charlotte, NC, USA, http://ieeexplore.ieee.org/document/7104417/


[*] X. Li, S. Dusmez, B. Akin, and K. Rajashekara, “A new SVPWM for phase current reconstruction of three-phase three-level T-type converter”,
in Proc. IEEE APEC Annu. Meeting, Charlotte, NC, USA, (Best Paper Pres. Award), http://ieeexplore.ieee.org/document/7104558/


[*] X. Li, S. Dusmez, B. Akin, and K. Rajashekara, “Vector based dead-time compensation for three-level T-type converter”,
in Proc. IEEE APEC Annu. Meeting, Charlotte, NC, USA, http://ieeexplore.ieee.org/document/7104551/


[*] M. Krenik, X. Li, and B. Akin, “Improved TOF determination algorithms for robust ultrasonic positioning of smart tools”,
in Proc. IEEE IECON Annu. Meeting, Dallas, TX, http://ieeexplore.ieee.org/document/7048831/


[*] Serkan Dusmez, Xiong Li, B. Akin "A Single-Stage Three-Level Isolated PFC Converter",
in Proc. IEEE ECCE Annu. Meeting, Pittsburgh, PA, http://ieeexplore.ieee.org/document/6953447/


[*] Xiong Li, Serkan Dusmez, B. Akin and R. Kaushik, "Capacitor Voltage Balancing Control of a Fully Integrated Three-Level Isolated AC-DC PFC Converter for Reliable Operations"
in Proc. IEEE ECCE Annu. Meeting, Pittsburgh, PA, http://ieeexplore.ieee.org/document/6953440/


[*] X. Li, S. Dusmez, B. Akin, and K. Rajashekara, “A new fault tolerant SVPWM strategy for multilevel converters”,
in Proc. IEEE IECON Annu. Meeting, Dallas, TX,http://ieeexplore.ieee.org/document/7049171/


[*] X. Li, B. Akin, and K. Rajashekara, “A new hybrid SVPWM strategy to minimize the neutral point voltage ripple of a three-level T-type converter”,
in Proc. IEEE IECON Annu. Meeting, Dallas, TX, (Best Paper Pres. Award), http://ieeexplore.ieee.org/document/7049120/


[*] S. Dusmez and B. Akin, “A Variable DC Link Approach for High Power Factor Three-Level Single-Stage PFC Converter,”
in Proc. IEEE ISIE, Istanbul,Turkey, http://ieeexplore.ieee.org/document/6864646/


[*] M. Bhardwaj, S.Choudhury, R. Poley, B. Akin "Online Frequency Response Analysis: a Powerful Plug-in Tool for Compensation Design & Health Assessment of Digitally Controlled Power Converters"
in Proc. IEEE APEC Annu. Meeting, Fort Worth, TX, http://ieeexplore.ieee.org/document/7394160/


[*] M. Bhardwaj, S. Choudhury, B. Akin "Online LCL Filter Compensation Using Embedded FRA"
in Proc. IEEE APEC Annu. Meeting, Fort Worth, TX, http://ieeexplore.ieee.org/document/6803761/


[*] Li, X., Akin, B., Rajashekara, K. "Novel Input Switched Multilevel Converter with SVPWM Modulation"
in Proc. IEEE ECCE (Asia), Hiroshima Japan, http://ieeexplore.ieee.org/document/6869585/


[*] B. Akin, M. Bhardwaj "Integrated Design of Efficient & Reliable Motor Drive and PFC Using Low Cost Microcontroller with Embedded PGAs and CLA"
in Proc. IEEE APEC Annu. Meeting, Long Beach, CA, http://ieeexplore.ieee.org/document/6520782/


[*] S. Choudhury, B. Akin, M. Bhardwaj, "Digital Control of Dual Output Interleaved PFC Using Single Input Current Sense"
in Proc. IEEE APEC Annu. Meeting, Long Beach, CA, http://ieeexplore.ieee.org/document/6520604/


[*] L. Xiong, U. R. Prasanna, B. Akin, K. Rajashekara, "A Virtual Power Electronics Lab to Explore DSP Peripherals and Practice DSP Based Digital Motion Control"
in Proc. IEEE COMPEL Annu. Meeting, Salt Lake, UT, 2013.  http://ieeexplore.ieee.org/document/6626422

[*] R.Kaushik, B. Akin "A Review of Cryogenic Power Electronics – Status and Applications"
in Proc. IEEE IEMDC Annu. Meeting, Chicago, IL, http://ieeexplore.ieee.org/document/6556204/


[*] M. Bhardwaj, S. Bharathi, B. Akin, "Controlling and Monitoring Solar Energy Production in the Smart Grid Using Heterogeneous Dual Core MCU"
in Proc. IEEE APEC Annu. Meeting, Orlando, FL, http://ieeexplore.ieee.org/document/6166066/


[*] Q. Ling, B. Akin. "A SVPWM for Three-Phase Current Reconstruction on Single DC-Link Shunt"
in Proc. PCIM Annu. Meeting, Nuremberg Germany, 2012.

[*] M. Bhardwaj, B. Akin, "Digital Control of Two Phase Interleaved PFC and Motor Drive using MCU with CLA"
in Proc. IEEE APEC Annu. Meeting, Dallas, TX, http://ieeexplore.ieee.org/document/5744625/


[*] B. Akin, M. Bhardwaj "Digital Control and Light Load Efficiency Enhancement of LLC Resonant Converters using Low Cost MCU"
in Proc. PCIM Annu. Meeting, Nuremberg Germany, 2011.

[*] B. Akin, M. Bhardwaj "An Integrated Implementation of Multiple AC Motor Control and Two Phase Interleaved PFC System Using Low Cost MCU for HVAC Applications"
in Proc. PCIM Annu. Meeting, Nuremberg Germany, 2010.

[*] B. Akin, U. Orguner, H. Toliyat, M. Rayner, "PWM Inverter Harmonics Contributions to the Inverter Fed IM Bearing Fault Diagnosis",
in Proc. IEEE APEC Annu. Meeting, Anaheim, CA,http://ieeexplore.ieee.org/document/4195901/


MAGAZINE ARTICLES and WHITE PAPERS

 

[*] Vardhan, H., Akin, B., Jin, H. "A Low-Cost High-Fidelity Processor-in-the Loop Platform for Rapid Prototyping of Power Electronics Circuits and Motor Drives",
IEEE Transactions on Power Electronics Magazine, June 2016 (Cover Story)

 

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[*] R. Kaushik, B. Akin "A Review of Cryogenic Power Conversion Systems for Electrification of Transportation",
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[*] B. Akin, D.Chang "Optimal Digital Power Control Using LLC Resonant Converters"
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