|The objective of this symposium, the first of its kind, is to bring together researchers and practitioners of mutation testing from all over the world. These individuals will share their experiences and insights into one of the most fascinating and powerful techniques for software testing, namely, Mutation! The originators of mutation testing will be keynote speakers. Research talks will focus on various practical and theoretical aspects of mutation testing. Symposium proceedings will be published. These proceedings will document the work done in mutation testing, and hence will serve as a long lasting reference for researchers, educators, and students. In addition, selected papers will also be published in a special issue of the Journal of Software Testing, Verification, and Reliability. The symposium is being organized the day before ISSRE 2000 as a convenience to those interested in both testing and reliability, and in participating in both the events.
Researchers and practitioners are invited to submit original manuscripts of either full paper or short paper describing work in any of the following areas:
Effectiveness of mutation
Comparison of mutation with other testing techniques
Tools for mutation
Experience with mutation
Mutation applied to OO programs
Novel applications of mutation
Submitted manuscripts should be in English and no longer than 5000 words or 20 double-spaced pages for full papers, and 2500 words or 10 double-spaced pages for short papers. All submissions must be made electronically in Word, PDF or postscript format. Each submission should include title, all authors' names, affiliations, and complete mail and electronic mail addresses, together with an abstract not exceeding 200 words and keyword list of 4 - 5 keywords. Final versions of accepted papers will be limited to 10 pages for long papers and 5 pages for short papers in the IEEE proceedings format described at http://computer.org/cspress/instruct.htm.