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Advanced Program for Mutation'2000

==============================================
Friday (October 6th)
==============================================
8:30-10:00  Keynote 

     Rich DeMillo: Why Software Falls Down
     (Vice President, Applied Research, Telcordia Technologies)

     Dick Lipton: Mutation: The Early Days
     (Professor, Princeton University)


10:00-10:30  Coffee Break

10:30-12:00  Mutation: Application, Effectiveness, and 
             Test Generation (I)

     Investigating the effectiveness of object-oriented 
     strategies with the mutation method
     by Sunwoo Kim, John A. Clark and John A. McDermid
     (University of York, UK)

     The relationship between program dependence and 
     mutation testing by Mark Harman (Brunel University, UK), 
     Sebastian Danicic (University of London, UK) and 
     Rob Hierons (Brunel University, UK)

     Mutation of model checker specifications for test generation 
     and evaluation by Paul E. Black (National Institute of 
     Standards and Technology), Vadim Okun and Yaacov Yesha 
     (University of Maryland - Baltimore)

12:00-1:30  Lunch Break (Lunch is provided to 
            all registered participants)

1:30-3:00   Mutation: Cost Reduction

     Evaluation N-selective mutation for C programs: 
     Unit and Integration Testing.
     by Jose Maldonado, Ellen Barbosa, Auri Vincenzi, and 
     Marcio Delamaro (University of Sao Paulo, Brazil)

     Mutation 2000: uniting the orthogonal
     by Jeff Offutt (George Mason University) and 
     Roland Untch (Middle Tennessee State University)

     Unit and integration testing for C programs using 
     mutation-based criteria by Auri Vincenzi, Jose Maldonado, 
     Ellen Barbosa and Marcio Delamaro.
     (University of Sao Paulo, Brazil)

3:00-3:30  Coffee Break

3:30-5:00  Mutation: Application, Effectiveness, and 
           Test Generation (II)

     Trustable components: yet another mutation-based approach
     by Benoit Baudry, Vu Le Hanh, Jean-Marc Jezequel, Yves Traon
     (University of Beaulieu, France)
     
     Parallel firm mutation of Java programs
     by David Jackson and Martin Woodward
     (University of Liverpool, UK)

     Theoretical insights into the coupling effect
     by How Tai Wah (South Bank University, UK)

     Component customization testing technique using fault
     injection technique and mutation test criteria
     by Hoijin Yoon, Byoungju Choi
     (Ewha Womans University, Korea)

     Mutating network models to generate network security test cases
     by Ronald Ritchey (Booz, Allen & Hamilton)

5:00-6:00   Break

6:00-6:30   Cash Bar Reception

6:30-?      Banquet

==============================================
Saturday (October 7th)
==============================================
8:30-9:15   Keynote 

     Dick Hamlet: Programs Determined by Mutation-adequate Tests
     (Professor, Portland State University)

9:15-10:30  Panel: Future of Mutation Testing and Its Application

     Moderator: Jeff Offutt  (George Mason University) 
     Panelists:
     John Clark   (University of York, UK)
     Rich DeMillo (Telcordia Technologies)
     Dick Lipton  (Princeton University)
     Martin Woodward (University of Liverpool, UK)
  
10:30-11:00 Coffee Break

11:00-12:00 Interface Mutation 

     Interface mutation
     by Sudipto Ghosh (Colorado State University) and
     Aditya Mathur (Purdue University)

     Proteum/IM 2.0: an integrated mutation testing environment
     by Marcio Delamaro, Jose Maldonado, Auri Vincenzi
     (University of Sao Paulo, Brazil)

12:00-1:30  Lunch Break (You are on your own for lunch)

1:30-3:00   Tool Session

     TDS: A tool for Testing Distributed Component-Based 
     Applications by Sudipto Ghosh (Colorado State University) 
     and Aditya Mathur (Purdue University)
 
     Proteum: A family of tools to support specification and
     program testing based on mutation
     by Jose Maldonado, et al. (University of Sao Paulo, Brazil)

     Mugent: A tool uses a model checker to generate test vectors
     from a system specification by Paul Black (National Institute 
     of Standards and Technology)

3:00        Adjourn