THE UNIVERSITY OF TEXAS AT DALLAS

Home Research Publications Presentations

INVITED TALKS

4) “X-ray Photoelectron Spectroscopy: Fundaments and Applications”, RUIM 2007, Hermosillo, Sonora, November 28-30, 2007.

3) “Growth and characterization of Electronic Materials”, Seminar of the Department of Physics at Cinvestav-IPN, Mexico D.F., July 21, 2006.

2) “Electronic Materials”, Seminar at Cinvestav., Querétaro, July 19, 2006.

1) “Las olimpiadas de fisica y matematicas” Conference offered in the ITESM (Technological Institute for Superior Studies from Monterrey) - campus Culiacán, Sinaloa, May, 1995.

INTERNATIONAL CONFERENCES

13) “Study of surface preparation for high-k dielectrics on GaAs and InGaAs”, 38^th IEEE Semiconductor Interface Specialists Conference, Dec. 6-8, 2007, Washington, D.C.

12) “Study of High-κ Dielectrics on InGaAs for CMOS Applications”. 54^th AVS International Symposium, Seattle MA, Oct. 14-19, 2007.

11) “Surface Science of High-mobility Channels: Germanium”, Materials Structures and Devices Annual Review, Boston, May 9-10, 2007.

10) “Instrument characterization for quantitative ARXPS analysis”. 47^th IUVSTA Workshop on Angle-Resolved XPS, Cancun, Mexico, March 26-30, 2007.

9) “Nitrogen Incorporation in Hf-based High-k Dielectrics Upon Thermal and Plasma Treatments”, AVS 53^rd International Symposium, San Francisco, CA, Nov. 12-17, 2006.

8) “Study of Plasma and Thermally Nitrided ultra-thin Hf based high-k dielectrics”, 3^rd International Symposium on Advanced Gate Stack Technology (ISAGST), SEMATECH, Austin, TX, Sep. 27-29, 2006.

7) “XPS Study of Nitrided Hf-based high-k dielectrics". 2006 Texas Section of the APS Joint Fall Meeting. Arlington, Texas 2006.

6) “XPS Study of Se-passivated Si(100)”, 52^nd AVS International Symposium, Boston, Nov., 2005.

5) “Displacive Phase Transition in SrTiO₃ Thin Films Grown on Si(001)”. AVS 50^th International Symposium, Baltimore, Nov., 2003.

4) “Formation of the first monolayer of Sr on Si(001)”, 9^th Topical Conference on Quantitative Surface Analysis, a side conference of the 48^th AVS International Symposium, Morgan Hill, CA, Oct., 2001.

3) “Polarized extended x-ray absorption fine structure measurement of strain in epitaxial SrTiO3 on Si(001)”, 9th Topical Conference on Quantitative Surface Analysis. Morgan Hill, California, Oct., 2001 A side conference of the 48^th AVS International Symposium.

2) “Prediction of the Bonding Energy of Water to Methylcellulose from the Red-Shift of the Water Bending Mode”, 11^th International Conference on Thin Films. Cancun, Aug., 1999.

1) “Study on the interfaces for the hetero-structure ZnSe/CdTe/GaAs(100) grown by MBE”, XIV Simposio Latinoamericano de Física del Estado Sólido “Leo Falicov”. Oaxaca, Jan., 1998.

OTHER PRESENTATIONS

8) “Photoemission Spectroscopy from SrO/Si(001) ultra thin films”, Oral contribution: XXIII National Conference of the Mexican Vacuum and Surface Science Society. Huatulco, Sep, 2003.

7) “EXAFS Study on the local structure in epitaxial SrTiO₃ thin films on Si(001)”, Oral contribution: XXII National Conference of the Mexican Vacuum and Surface Science Society. Veracruz, Sep, 2002.

6) “Strain measurement of epitaxial SrTiO₃ films on Si(001)”, XXI National Conference of the Mexican Vacuum and Surface Science Society. Mazatlán, Oct, 2001.

5) “Photoemission Study of the Sr/Si(001) Interface”, XX National Conference of the Mexican Vacuum and Surface Science Society. Oaxaca, Aug, 2000.

4) “Análisis por espectroscopia Auger y por difracción de electrones de heteroestructuras ZnSe/CdTe/GaAs(100)”, XVIII National Conference of the Mexican Vacuum and Surface Science Society. Puerto Vallarta, Sep, 1998.

3) “Análisis Auger de superficies GaAs(100) preparadas bajo diferentes tratamientos químicos y térmicos para crecimiento epitaxial”, XVII National Conference of the Mexican Vacuum and Surface Science Society. Mazatlán, Sep, 1997.

2) “Auger spectroscopy of thin semiconducting films”, 5^th Summer of the Science (organized for the Mexican Academy of Science, AMC). Mazatlán, Aug, 1995.

1) “Erroneous mathematical concepts in outstanding high school students”. XXVII National Conference of the Mexican Mathematical Society. Querétaro, Oct, 1994.

PRESENTATIONS BY OTHERS

21) C. L. Hinkle, A. M. Sonnet, E. M. Vogel, S. McDonnell, M. Milojevic, B. Lee, F. S. Aguirre-Tostado, K. J. Choi, J. Kim, R. M. Wallace, “GaAs MOS Frequency Dispersion Reduction by Surface Oxide Removal and Passivation”. 38^th IEEE Semiconductor Interface Specialists Conference, Washington, D.C., December 6-8, 2007.

20) F.S. Aguirre-Tostado, M. Milojevic, S.J. McDonnell and R.M. Wallace, “XPS and LEISS Study of GaAs Surface Preparation using Ammonium Hydroxide”. 54^th AVS International Symposium, Seattle MA, Oct. 14-19, 2007.

19) F.S. Aguirre-Tostado, M. Milojevic, S.J. McDonnell, M.J. Kim, and R.M. Wallace, “Physical and Chemical Properties of Hf-based High-κ Dielectrics on Ge(001) for CMOS Applications”. 54^th AVS International Symposium, Seattle MA, Oct. 14-19, 2007.

18) M.I. Medina-Montes, M.V. Selvidge, F.S. Aguirre-Tostado, A. Herrera-Gomez, and R.M. Wallace, “Diffusion of La-based Layers on HfO₂/SiO₂/Si Dielectric Stacks,”. 54^th AVS International Symposium, Seattle MA, Oct. 14-19, 2007.

17) C. L. Hinkle, M. Milojevic, S. McDonnell, F. S. Aguirre-Tostado, A. M. Sonnet, R. M. Wallace, and E. M. Vogel, “GaAs Surface Modification by Arsenic Oxide Removal and Bond Conversion”. 4^th International Symposium on Advanced Gate Stack Technology (ISAGST), Dallas, TX, Sep. 25- 28, 2007.

16) B. Coss, F. Aguirre-Tostado, R. M. Wallace, and J. Kim, “Role of Lanthanum In the Gate Stack TaN/HfO2/SiO2/Si(001)”. 4^th International Symposium on Advanced Gate Stack Technology (ISAGST), Dallas, TX, Sep. 25- 28, 2007.

15) M. Milojevic, S.J. McDonnell, F.S. Aguirre-Tostado and R.M. Wallace “XPS study of GaAs surface preparation using ammonium hydroxide”, Materials Structures and Devices Annual Review, Boston, May 9-10, 2007.

14) Alberto Herrera-Gomez, Francisco S. Aguirre-Tostado and Robert M. Wallace, “Self consistent data analysis in ARXPS: Getting quantitative in depth profile analysis in ultra thin films”. 47^th IUVSTA Workshop on Angle-Resolved XPS, Cancun, Mexico, March 26-30, 2007.

13) A. Herrera-Gomez, Y. Sun, F.S. Aguirre-Tostado, R. Contreras-Guerrero, R.M. Wallace, Y. Hisao, and E. Flint, “Quantification of pinhole density in ultrathin diamond-like-carbon films”. 47^th IUVSTA Workshop on Angle-Resolved XPS, Cancun, Mexico, March 26-30, 2007.

12) Robert M. Wallace, F. Servando Aguirre-Tostado, Alberto Herrera-Gomez, Moon J.Kim, Jiyoung Kim, and Bruce E. Gnade, “High-k Gate Stack Stability at the Nanoscale”. Nano and Giga Challenges in Electronics and Photonics: From Atoms to Materials to Devices to System Architecture Symposium and Spring School (Tutorial Lectures) Phoenix, AZ, March 12-16, 2007.

11) F.S. Aguirre-Tostado, M.J. Kim, R.M. Wallace, Sreenivasan, K.-I. Seo, C.O. Chui, K.C. Saraswat, P.C. Mcintyre, F.A. Stevie, R. Garcia, Z. Zhu, and D.P. Griffis, “Thermal Stability of High-k Dielectrics on Ge(001)”. AVS 53^rd International Symposium, San Francisco, CA, Nov. 12-17, 2006.

10) A. Herrera-Gomez, F.S. Aguirre-Tostado, G. Pant, M.A. Quevedo-Lopez, P.D. Kirsch, B.E. Gnade, and R.M. Wallace, “Dependence of the Nitrogen Depth Profile on Annealing in HfSiON/SiON/Si(001) Ultrathin Films”. AVS 53^rd International Symposium, San Francisco, CA, Nov. 12-17, 2006.

9) A. Herrera-Gomez, F.S. Aguirre-Tostado, G.K. Pant, M. A. Quevedo-Lopez, Paul D. Kirsch, B.E. Gnade and R.M. Wallace, “Diffusion of Nitrogen in HfSiON/SiON/Si(001) Ultrathin Films”, 3rd International Symposium on Advanced Gate Stack Technology (ISAGST), SEMATECH, Austin, TX, September 27-29, 2006.

8) M.A. Quevedo-Lopez, P.D. Kirsch, S. Krishnan, H.N. Alshareef, J. Barnett, H.R. Harris, A. Neugroschel, F.S. Aguirre-Tostado, B.E. Gnade, M.J. Kim, R.M. Wallace, and B.H. Lee, “Systematic Gate Stack Optimization to Maximize Mobility with HfSiON EOT Scaling ,” 36^th European Solid-State Device research Conference, Montreaux, Switzerland, Sep. 18-22, 2006.

7) Herrera-Gómez, A., Aguirre-Tostado, F.S., Mathews, C.S. “Self consistent data analysis in ARXPS: Gettingquantitative in depth profile analysis in ultra thin films”. Surface Analysis ’06 Topical Conference of the Applied Surface Science Division of the AVS, Albuquerque, NM, May 2006.

6) P. Zhao, F.S. Aguirre-Tostado, J. Kim, M.J. Kim, B.E. Gnade, and R.M. Wallace, “Thermal Stability of Amorphous LaAlO₃ Thin Films on Si(100) Deposited by Plasma Sputtering and Molecular Beam Deposition,” SRC Techcon 2005, Portland, OR, Oct. 25, 2005.

5) P. Sivasubramani, P. Zhao, F.S. Aguirre-Tostado, J. Kim, M.J. Kim, B.E. Gnade, and R.M. Wallace, “The Effect of Nitrogen Incorporation on the Thermal Stability of La, Hf-aluminate Gate Stacks on Silicon”, AVS 52^nd International Symposium, Boston MA, Nov. 2005.

4) J.C. Woicik, F.S. Aguirre-Tostado, A. Herrera-Gomez, R. Droopad, and Z. Yu, “Tetragonal plus displacive ferroelectric distortion in thin SrTiO₃ films grown on Si(001)”, 204th Meeting of The Electrochemical Society. Orlando, FL, Oct. 12-16, 2003.

3) G. Velázquez de la Cruz, F.S. Aguirre-Tostado, et. al., “Bonding of Water to Methylcellulose”, 11^th International Conference on Thin Films. Cancun, Mexico, August , 1999.

2) E. López-Luna, F.S. Aguirre-Tostado , et. al., “Auger analysis of GaAs(001) surfaces prepared under different thermal and chemical treatments as substrates for the growth by MBE” XIV Simposio Latinoamericano de Física del Estado Sólido “Leo Falicov”. Oaxaca, January, 1998.

1) I. Hernández-Calderón, F.S. Aguirre-Tostado, C. Vargas-Hernández, E. López-Luna and O. de Melo, “Interfacial reactivity of ZnSe/CdTe layers by molecular beam epitaxy”, II Workshop on Optoelectronic Materials and Their Applications (Including Solar Cells), La Habana, Cuba,Nov. 2-6, 1998.