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14) F.S. Aguirre-Tostado, M. Milojevic, S. McDonnell, B. Lee, C. Hinkle, K.J. Choi, E. Vogel, J. Kim R.M. Wallace, T. Yang, Y. Xuan and P.D. Ye, “Interface passivation of nanolaminated HfO₂/Al₂O₃ on GaAs for metal-oxide-semiconductor applications”, Beign submitted to Appl. Phys. Lett. (2008). Get PDF

13) F.S. Aguirre-Tostado, M. Milojevic, S. McDonnell, and R. M. Wallace, “Indium stability on InGaAs during atomic H surface cleaning”, Being submitted to Appl. Phys. Lett. (2008). Get PDF

12) B.E. Coss, H.C. Kim, F.S. Aguirre-Tostado, R.M. Wallace and J. Kim, “Role of Lanthanum in the Gate Stack, Co-sputtered TaLaN metal gates on Hf-based dielectrics.”, Microelectronic Engineering, In Press (2008). Get PDF

11) C.L. Hinkle, A.M. Sonnet, E.M. Vogel, S. McDonnell, G.J. Hughes, M. Milojevic, B. Lee, F.S. Aguirre-Tostado, K.J. Choi, H.C. Kim, J. Kim, and R.M. Wallace, “GaAs interfacial self-cleaning by atomic layer deposition”, Appl. Phys. Lett. 92, 071901 (2008). Get PDF

10) A. Herrera-Gomez, F. S. Aguirre-Tostado, Y. Sun, R. Contreras-Guerrero, R.M. Wallace, Y. Hisao and E. Flint, “Quantification of pinhole density in ultrathin diamond-like carbon films”, Surf. Interface Anal. 39, p. 904-907 (2007). Get PDF

9) F. S. Aguirre-Tostado, D. Layton, A. Herrera-Gomez, R.M. Wallace, J. Zhu, G. Larrieu, E. Maldonado, W.P. Kirk, and M. Tao, “X-ray photoelectron spectroscopy study of the oxidation of Se passivated Si(001)”, J. Appl. Phys. 102, p. 84901 (2007). Get PDF

8) C.L. Hinkle, A. M. Sonnet, E.M. Vogel, S. McDonnell, G.J. Hughes, M. Milojevic, B. Lee, F.S. Aguirre-Tostado, K.J. Choi, J. Kim, and R.M. Wallace, “Frequency dispersion reduction and bond conversion on n-type GaAs by in situ surface oxide removal and passivation”, Appl. Phys. Lett. 91, p. 163512 (2007). Get PDF

7) T. Yang, Y. Xuan, D. Zemlyanov, T. Shen, Y. Q. Wu, J. M. Woodall, P.D. Ye, F.S. Aguirre-Tostado, M. Milojevic, S. McDonnell, and R. M. Wallace, “Interface studies of GaAs metal-oxide-semiconductor structures using atomic-layer-deposited HfO2/Al₂O₃ nanolaminate gate dielectric”, Appl. Phys. Lett. 91, p. 142122 (2007). Get PDF

6) P. McIntyre, D. Chi, C.O. Chui, H. Kim, K.I. Seo, K. Saraswat, R. Sreenivasan, T. Sugawara, F.S. Aguirre-Tostado, and R.M. Wallace, “Interface Layers for High-k/Ge Gate Stacks: Are They Necessary?”, ECS Trans. 3, p. 519 (2006). Get PDF

5) H.N. Alshareef, K. Choi, H.C. Wen, H. Luan, H. Harris, Y. Senzaki, P. Majhi, B.H. Lee, R. Jammy, S. Aguirre-Tostado, B.E. Gnade, and R.M. Wallace, “Composition dependence of the work function of Ta_1–xAl_xN_y metal gates”, Appl. Phys. Lett. 88, p. 72108 (2006). Get PDF

4) J.C. Woicik, F.S. Aguirre-Tostado, A. Herrera-Gómez, R. Droopad, Z. Yu, D.G. Schlom, J. Karapetrova, P. Zschack, and P. Pianetta, “X-ray absorption fine-structure determination of interfacial polarization in SrTiO₃ thin film grown on Si(001)”, Physica Scripta T115, p. 620-622 (2005). Get PDF

3) F.S. Aguirre-Tostado, A. Herrera-Gómez, J.C. Woicik, R. Droopad, Z. Yu, D.G. Schlom, P. Zschack, E. Karapetrova, P. Pianetta, and C.S. Hellberg, “Elastic anomaly for SrTiO₃ thin films grown on Si(001)”, Phys. Rev. B 70, p. 201403 (2004). Get PDF

2) F.S. Aguirre-Tostado, A. Herrera-Gómez, J.C. Woicik, R. Droopad, Z. Yu, D.G. Schlom, J. Karapetrova, P. Zschack, and P. Pianetta, “Displacive phase transition in SrTiO₃ thin films grown on Si(001)”, J. Vac. Sci. Technol. A 22, p. 1356 (2004). Get PDF

1) A. Herrera-Gómez, F.S. Aguirre-Tostado, Y. Sun, P. Pianetta, Z. Yu, D. Marshall, R. Droopad, and W.E. Spicer, “Photoemission from the Sr/Si(001) interface”, J. Appl. Phys. 90, p. 6070 (2001). Get PDF

Proceedings

4) M.A. Quevedo-Lopez, P.D. Kirsch, S. Krishnan, H.N. Alshareef, J. Barnett, H.R. Harris, A. Neugroschel F.S. Aguirre-Tostado, B.E. Gnade, M.J. Kim, R.M. Wallace and B.H. Lee, “Systematic Gate Stack Optimization to Maximize Mobility with HfSiON EOT Scaling”, Proceeding of the 36th European Solid-State Device Research Conference (ESSDERC 2006), p. 113-116 (2006). Get PDF

3) J.C. Woicik, F.S. Aguirre-Tostado, A. Herrera-Gomez, R. Droopad, Z. Yu, D. Schlom, P. Zschack, J. Karapetrova, P. Pianetta, “Elastic anomaly in SrTiO₃ thin films grown on Si(001)”, Proceedings - Electrochemical Society PV 2003-31, p. 17-22 (2006). Get PDF

2) J.C. Woicik, F.S. Aguirre-Tostado, A. Herrera-Gomez, R. Droopad, Z. Yu, D.G. Schlom, P. Zschack, J. Karapetrova, C.S. Hellberg, “Elastic anomaly for SrTiO₃ thin films grown on Si(001)”, Microscopy and Microanalysis 10 (SUPPL. 2), p. 826-827 (2004). Get PDF

1) I. Hernández-Calderón, F.S. Aguirre-Tostado, C. Vargas-Hernández, E. López-Luna and O. de Melo, “Interfacial reactivity of ZnSe/CdTe layers by molecular beam epitaxy”, Proc. of the II Workshop on Optoelectronic Materials and Their Applications (Including Solar Cells). La Habana-Cuba, November 2-6th, 1998, eds. F. Leccabue, M. Sánchez, and A. Escobosa, Edizioni ETS (Pisa, Italy, 1999). p. 113-118 (1999). Get PDF