Welcome to Lawrence J. Overzet's Web Pages

UNDER RECONSTRUCTION (slowly...)   Updated: 10/97

THE UNIVERSITY OF TEXAS AT DALLAS
ERIK JONSSON SCHOOL OF ENGINEERING & COMPUTER SCIENCE

EE 3310: ELECTRONIC DEVICES:
Instructor: Dr. Lawrence J. Overzet
Telephone: UTD-2154; after 4 rings you get my message service
Office Hours: Are setup each semester, EC 2.930
Textbook: Semiconductor Device Fundamentals, R. F. Pierret.
Useful references: Solid State Electronic Devices; Fourth Edition, B. G. Streetman

Course Schedule:
 
Date Topic Reading
1/9 Introduction to course, Quantum Mechanics  1 - 2.1, App. A
1/14 Charge carriers, bonding in solids, energy bands, effective mass  2.2 - 2.3
1/16 Fermi statistics, density of states, carrier concentrations  2.4 - 2.5.1
1/21 Charge carrier concentrations, law of mass action.  2.5 - 2.6
1/23 Carrier drift and mobility, resistivity, and drift current.  3.1.1 - 3.1.4
1/28 Band bending, diffusion, Einstein relationship  3.1.5 - 3.2
1/30 Excess carriers, generation and recombination, lifetime  3.3 - 3.4
2/4 Diffusion length, quasi-Fermi level, photo conductivity  3.5 - 3.6
2/6 Continuity equations, possible make-up period, review, Q & A  4 (read only)
2/11 Intro. to pn junctions, equilibrium, contact potential, space charge  5.1 - 5.2
2/13 EXAM # 1 (Chp. 1 - 3) 
2/18 Junction width, pn junction with bias, energy band diagrams  5..2 - 5.3
2/20 Ideal diode I-V Eqn., carrier injection and distribution  6.1
2/25 Carrier currents, reverse bias breakdown, charge control analysis  6.1, 6.2.2, 6.3.1
2/27 PN junctions A-C bias response, capacitance  Chp. 7
3/4 PN junctions transient bias response  Chp. 8, (read only 9.3 - 9.4)
3/6 Metal-Semiconductor junctions, Ohmic contacts, Schottky barriers  Chp. 14
3/11 SPRING BREAK
3/13 SPRING BREAK
3/18 Introduction to amplification, introduction to FET (JFET)  15.1 - 15.2.2
3/20 EXAM #2 (Chp. 4 - 9) 
3/25 JFET I-V relationship, MESFET  15.2.3 - 15.4
3/27 IGFET introduction, MOS structures, qualitative electrostatics  16.1 - 16.2
4/1 MOS devices, quantitative electrostatics, threshold voltages  16.3
4/3 Capacitance - voltage characteristics  16.4 - 16.5
4/8 MOSFET qualitative theory of operation, ideal  17.1 - 17.2.1
4/10 MOSFET quantitative ID - VD, AC response  17.2 - 17.3
4/15 Threshold voltages in non-ideal MOS  18.1 - 18.3
4/17 BJT basics: statics, band diagrams, basic operation parameters  10.1, 10.3 - 10.5
4/22 Ideal BJT I-V relationship: Ebers-Moll equations  11.1
4/24 EXAM #3 (Chp. 14 - 18) 
4/29 BJT transient bias response  12.1 - 12.3
5/6 FINAL EXAM 5:00 pm in EC2.126  Comprehensive

  Homework: Homework will be assigned on Tuesday or Thursday and is due at the beginning of the following Tuesday. Each student must turn in individual work. All assigned work will be collected.

Course grading:

10% Weekly Assigned Homework
20% Exam I
20% Exam II
20% Exam III
30% Final Exam

Last day to drop this course with an automatic W is Thursday, March 20.


 
 
 
THE UNIVERSITY OF TEXAS AT DALLAS
ERIK JONSSON SCHOOL OF ENGINEERING & COMPUTER SCIENCE

EE 3210: ELECTRONIC DEVICES: SPRING 1997
Instructor: Dr. Lawrence J. Overzet
Telephone: UTD-2154; after 4 rings you get my message service
Office Hours: Are setup each semester, EC 2.930
Textbook: Electronic Devices Laboratory Manual, J. van der Ziel
Useful references: Semiconductor Device Fundamentals, R. F. Pierret.
Solid State Electronic Devices; Fourth Edition, B. G. Streetman

Laboratory Schedule:
 
Date: Lab. (Number and Topic) 
1/16 LAB #0 Introduction to course, ASSIGN: Study LabView 
1/23 LAB #1 Introduction to the Laboratory, Equipment, and LabView 
1/30 LAB #2 Conductivity and the Hall effect 
2/6 LAB #3 Silicon Diode Characteristics 
2/13 LAB #4 Visible Light Emitting Diodes 
2/20 LAB #5 Silicon Diode Solar Cells 
2/27 LAB #6 Small Signal Models of pn Junction Diodes 
3/6 LAB #6 cont'd
3/13 SPRING BREAK
3/20 LAB #7 Transient Performance of pn Junction Diodes 
3/27 LAB #12 JFET Characteristics 
4/3 LAB #13 MOSFET Characteristics (I) 
4/10 LAB #14 MOSFET Characteristics (II) 
4/17 LAB #8 DC Characteristics and biasing of the BJT 
4/24 LAB #9 Small Signal Models of the BJT 

  Laboratory grading: See the Lab Manual for further details.

15% Homework (Pre-laboratories)
10% Laboratory Performance (judged by participation)
10% Laboratory Notebook
65% Laboratory Reports

Last day to drop this course with an automatic W is listed in the catalog.
If you drop the EE3210 Lab, you must also drop the EE3310 class.


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University of Texas at Dallas,
P.O. Box 830688, EC33
Richardson, TX 75083-0688
Tel: (972)883-2154
Fax: (972)883-6839
email: overzet@utdallas.edu
 

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