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THE UNIVERSITY OF TEXAS AT
DALLAS
ERIK JONSSON SCHOOL OF ENGINEERING & COMPUTER SCIENCE
EE 3310: ELECTRONIC DEVICES:
Instructor: Dr. Lawrence J. Overzet
Telephone: UTD-2154; after 4 rings you get my message service
Office Hours: Are setup each semester, EC 2.930
Textbook: Semiconductor Device Fundamentals, R. F. Pierret.
Useful references: Solid State Electronic Devices; Fourth Edition,
B. G. Streetman
Course Schedule:
| Date |
Topic |
Reading |
| 1/9 |
Introduction to course, Quantum Mechanics |
1 - 2.1, App. A |
| 1/14 |
Charge carriers, bonding in solids, energy bands, effective
mass |
2.2 - 2.3 |
| 1/16 |
Fermi statistics, density of states, carrier concentrations |
2.4 - 2.5.1 |
| 1/21 |
Charge carrier concentrations, law of mass action. |
2.5 - 2.6 |
| 1/23 |
Carrier drift and mobility, resistivity, and drift current. |
3.1.1 - 3.1.4 |
| 1/28 |
Band bending, diffusion, Einstein relationship |
3.1.5 - 3.2 |
| 1/30 |
Excess carriers, generation and recombination, lifetime |
3.3 - 3.4 |
| 2/4 |
Diffusion length, quasi-Fermi level, photo conductivity |
3.5 - 3.6 |
| 2/6 |
Continuity equations, possible make-up period, review,
Q & A |
4 (read only) |
| 2/11 |
Intro. to pn junctions, equilibrium, contact potential,
space charge |
5.1 - 5.2 |
| 2/13 |
EXAM # 1 (Chp. 1 - 3) |
|
| 2/18 |
Junction width, pn junction with bias, energy band
diagrams |
5..2 - 5.3 |
| 2/20 |
Ideal diode I-V Eqn., carrier injection and distribution |
6.1 |
| 2/25 |
Carrier currents, reverse bias breakdown, charge control
analysis |
6.1, 6.2.2, 6.3.1 |
| 2/27 |
PN junctions A-C bias response, capacitance |
Chp. 7 |
| 3/4 |
PN junctions transient bias response |
Chp. 8, (read only 9.3 - 9.4) |
| 3/6 |
Metal-Semiconductor junctions, Ohmic contacts, Schottky
barriers |
Chp. 14 |
| 3/11 |
SPRING BREAK |
|
| 3/13 |
SPRING BREAK |
|
| 3/18 |
Introduction to amplification, introduction to FET (JFET) |
15.1 - 15.2.2 |
| 3/20 |
EXAM #2 (Chp. 4 - 9) |
|
| 3/25 |
JFET I-V relationship, MESFET |
15.2.3 - 15.4 |
| 3/27 |
IGFET introduction, MOS structures, qualitative electrostatics |
16.1 - 16.2 |
| 4/1 |
MOS devices, quantitative electrostatics, threshold voltages |
16.3 |
| 4/3 |
Capacitance - voltage characteristics |
16.4 - 16.5 |
| 4/8 |
MOSFET qualitative theory of operation, ideal |
17.1 - 17.2.1 |
| 4/10 |
MOSFET quantitative ID - VD, AC response |
17.2 - 17.3 |
| 4/15 |
Threshold voltages in non-ideal MOS |
18.1 - 18.3 |
| 4/17 |
BJT basics: statics, band diagrams, basic operation parameters |
10.1, 10.3 - 10.5 |
| 4/22 |
Ideal BJT I-V relationship: Ebers-Moll equations |
11.1 |
| 4/24 |
EXAM #3 (Chp. 14 - 18) |
|
| 4/29 |
BJT transient bias response |
12.1 - 12.3 |
| 5/6 |
FINAL EXAM 5:00 pm in EC2.126 |
Comprehensive |
Homework: Homework will be assigned on Tuesday or Thursday and is
due at the beginning of the following Tuesday. Each student must turn in
individual work. All assigned work will be collected.
Course grading:
10% Weekly Assigned Homework
20% Exam I
20% Exam II
20% Exam III
30% Final Exam
Last day to drop this course with an automatic W is Thursday, March
20.
THE UNIVERSITY OF TEXAS AT
DALLAS
ERIK JONSSON SCHOOL OF ENGINEERING & COMPUTER SCIENCE
EE 3210: ELECTRONIC DEVICES: SPRING 1997
Instructor: Dr. Lawrence J. Overzet
Telephone: UTD-2154; after 4 rings you get my message service
Office Hours: Are setup each semester, EC 2.930
Textbook: Electronic Devices Laboratory Manual, J. van der Ziel
Useful references: Semiconductor Device Fundamentals, R. F. Pierret.
Solid State Electronic Devices; Fourth Edition, B. G. Streetman
Laboratory Schedule:
| Date: |
Lab. (Number and Topic) |
| 1/16 |
LAB #0 Introduction to course, ASSIGN: Study LabView |
| 1/23 |
LAB #1 Introduction to the Laboratory, Equipment, and LabView |
| 1/30 |
LAB #2 Conductivity and the Hall effect |
| 2/6 |
LAB #3 Silicon Diode Characteristics |
| 2/13 |
LAB #4 Visible Light Emitting Diodes |
| 2/20 |
LAB #5 Silicon Diode Solar Cells |
| 2/27 |
LAB #6 Small Signal Models of pn Junction Diodes |
| 3/6 |
LAB #6 cont'd |
| 3/13 |
SPRING BREAK |
| 3/20 |
LAB #7 Transient Performance of pn Junction Diodes |
| 3/27 |
LAB #12 JFET Characteristics |
| 4/3 |
LAB #13 MOSFET Characteristics (I) |
| 4/10 |
LAB #14 MOSFET Characteristics (II) |
| 4/17 |
LAB #8 DC Characteristics and biasing of the BJT |
| 4/24 |
LAB #9 Small Signal Models of the BJT |
Laboratory grading: See the Lab Manual for further details.
15% Homework (Pre-laboratories)
10% Laboratory Performance (judged by participation)
10% Laboratory Notebook
65% Laboratory Reports
Last day to drop this course with an automatic W is listed in the catalog.
If you drop the EE3210 Lab, you must also drop the EE3310 class.
University of Texas at Dallas,
P.O. Box 830688, EC33
Richardson, TX 75083-0688
Tel: (972)883-2154
Fax: (972)883-6839
email: overzet@utdallas.edu
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