Department of Geosciences
Scanning Electron Microscopy Facility
In scanning electron microscopy (SEM) an electron beam is focused into
a small probe and is rastered across the surface of a specimen. Several
interactions with the sample that result in the emission of electrons or
photons occur as the electrons penetrate the surface. These emitted particles
can be collected with the appropriate detector to yield valuable information
about the material.
The most immediate result of observation in the scanning electron microscope
is that it displays the shape of the sample. It can also be used to determine
the local composition, the crystal structure and orientation, and electrical
and optical properties.
A scanning electron
microscope capable of produce images ranging from high magnification and
resolution to deep focus and low magnification.
of Geosciences | E.M.
Coater ; Large sample size, with thickness monitored providing an
automatic deposition, Etch and Pulse modes.