Department  of Geosciences

 Scanning Electron Microscopy Facility

In scanning electron microscopy (SEM) an electron beam is focused into a small probe and is rastered across the surface of a specimen. Several interactions with the sample that result in the emission of electrons or photons occur as the electrons penetrate the surface. These emitted particles can be collected with the appropriate detector to yield valuable information about the material.
The most immediate result of observation in the scanning electron microscope is that it displays the shape of the sample. It can also be used to determine the local composition, the crystal structure and orientation, and electrical and optical properties.
-JEOL T300
A scanning electron microscope capable of produce images ranging from high magnification and resolution  to deep focus and low magnification.

Sputter Coater ; Large sample size, with  thickness monitored providing an automatic deposition, Etch and Pulse modes.

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