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On-Chip Atomic Force Microscope: Why and How presented by Dr. Reza Moheimani
Friday, Nov 10, 2017
11 a.m. - 12 p.m. Location: RL 3.204

Abstract – The Atomic Force Microscope (AFM) is a complex mechatronic system and a powerful tool for high-resolution imaging and manipulation of matter with sub-nanometre precision. The high resolution and versatility of the AFM has made it a vital tool for imaging and characterizing material surfaces in a variety of fields such as biology, chemistry, materials science, nanotechnology and the semiconductor industry. However, the AFM suffers from inherent limitations in imaging speed. It typically takes more than 30 seconds for a commercial AFM to produce a single image. Consequently, there is significant push to develop high speed AFMs. In this talk, we review recent progress in high-speed atomic force microscopy, emphasizing the latest efforts to develop a MEMS-based high-speed on-chip atomic force microscope.

Bio - Reza Moheimani currently holds the James Von Ehr Distinguished Chair in Science and Technology in Department of Mechanical Engineering at the University of Texas at Dallas. His current research interests include ultrahigh-precision mechatronic systems, with particular emphasis on dynamics and control at the nanometer scale, including applications of control and estimation in nanopositioning systems for high-speed scanning probe microscopy and nanomanufacturing, modeling and control of microcantilever-based devices, control of microactuators in microelectromechanical systems, and design, modeling and control of micromachined nanopositioners for on-chip scanning probe microscopy.

Dr. Moheimani is a Fellow of IEEE, IFAC and the Institute of Physics, U.K. His research has been recognized with a number of awards, including IFAC Nathaniel B. Nichols Medal (2014), IFAC Mechatronic Systems Award (2013), IEEE Control Systems Technology Award (2009), IEEE Transactions on Control Systems Technology Outstanding Paper Award (2007) and several best paper awards in various conferences. He is Editor-in-Chief of Mechatronics and has served on the editorial boards of a number of other journals, including IEEE Transactions on Mechatronics, IEEE Transactions on Control Systems Technology, and Control Engineering Practice. He is a former chair of the IFAC Technical Committee on Mechatronic Systems.

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