Comet Calendar, The Official Event Calendar for UT Dallas en-us This week's events for Engineering and Computer Science at UT Dallas Study of Yield-Stress Fluid-Assisted 3D Printing System by Dr. Yifei Jin - University of Florida Wednesday, Jan 23
(9 a.m. - 10 a.m.)


Freeform fabrication of three-dimensional (3D) structures has been of great interest in recent years and widely used for various applications such as flexible electronic devices, tissue engineering and regenerative medicine, and soft robotics, to name a few. The emergence of 3D printing provides a powerful tool for on-demand fabrication of complex 3D structures. Since the current 3D printing approaches have some constraints, it always calls for new 3D printing techniques for various liquid build material printing. Thus, a yield-stress fluid-assisted 3D printing system has been investigated to fabricate 3D structures in a printing-then-solidification fashion. In the system, two yield-stress fluids have been studied including a hydrophilic nanoclay suspension for 3D bioprinting applications and a hydrophobic fumed silica suspension for 3D printing of functional structures. Using the nanoclay suspension either as a support bath material or as an internal scaffold material, complex cellular and/or acellular structures from biocompatible ink materials can be successfully 3D printed. Using the fumed silica suspension as a support bath, complex 3D functional structures from various hydrophobic inks can be effectively 3D printed.


Dr. Yifei Jin is a postdoctoral researcher in the Department of Mechanical and Aerospace Engineering at the University of Florida. He received his Ph. D. in Mechanical Engineering from the University of Florida in 2018 and was awarded the “Best Dissertation Award” due to his achievements in the graduate years. Dr. Jin’s research interests include 3D bioprinting of living tissue constructs, 3D printing of hydrophobic functional structures, yield-stress fluids for 3D printing applications, stimuli-responsive materials for 4D printing applications, and fabrication of multi-layered capsules. His research emphasizes the coupling of materials and fabrication approaches to develop novel 3D printing techniques.


Notice of Final Oral Examination ~ Adam T. Barton ~ Materials Science and Engineering Friday, Jan 25
(9 a.m.)

All Faculty Are Invited to the Final Examination of


Adam T. Barton

Graduate Program in Materials Science and Engineering

January 25, 2019, 9:00 a.m., SPN 1.111


Title of Dissertation:

Molecular Beam Epitaxy of Van Der Waals Materials for Applications in Novel Logic and Memory Devices


Student’s Supervising Committee:

Christopher L. Hinkle, Chair

Luigi Colombo

Moon J. Kim

Robert M. Wallace

Jonsson School Distinguished Lecture Series presents Dr. Dushan Boroyevich Friday, Jan 25
(11 a.m. - 12 p.m.) Location: ECSS 2.102 - TI Auditorium.

Dr. Dushan Boroyevich
University Distinguished Professor
Associate Vice President of Research and Innovation, Energy Innovation Initiative
Virginia Tech

"Future Electronic Energy Systems”

Researchers anticipate widespread usage of new power electronics technologies in electrical energy generation. Transport and consumption will provide major efficiency improvements, while the deployment of smart grid technologies should improve the utilization and availability of electricity. Consequently, after a decade of premonition, many experts expect that future human energy needs will be met most dominantly by electricity, delivered through scalable, hierarchical, electronic energy systems: the Intergrid. Safe, dependable, sustainable, enjoyable and beautiful supply of free energy will be available anytime, anywhere, for everyone.

The proposed structure achieves hierarchical, dynamic decoupling of generation, distribution and consumption by using bidirectional electronic power converters as electronic energy routers. Similar trends are appearing in modern electronic power distribution systems built for airplanes, ships, road and off-road vehicles, data-centers, industrial processes and buildings. These systems often comprise hundreds of electronic power converters, introducing a distinction that challenges our basic understanding about how power systems are designed and operated. The challenge seems more daunting when considering how the electrical grid will accommodate the massive onslaught of renewable and distributed generation. Therefore, innovative methods must provide easier system-level modeling, improved system integration and continuous assessment of dynamic interactions.

Starting from the current and expected trends in the generation, transport and consumption of electrical energy, this talk will contemplate possible future AC and DC electronic energy system architectures, especially in the presence of renewable energy sources. The speaker will also discuss possible directions for modeling, analysis and system-level design of such systems, including power flow control, protection, stability and subsystem interactions.


Dr. Dushan Boroyevich is the University Distinguished Professor and Associate Vice President for Research and Innovation in Energy Systems at Virginia Polytechnic Institute and State University (Virginia Tech), as well as Director of the Center for Power Electronics Systems. Previously, he was an assistant professor and director of the Power and Industrial Electronics Research Program in the Institute for Power and Electronic Engineering at the University of Novi Sad, in the former Yugoslavia. He completed a bachelor’s degree in 1976 from the University of Belgrade and an M.S. in 1982 from the University of Novi Sad. He earned his Ph.D. in 1986 from Virginia Tech.

Boroyevich has led numerous research projects in the areas of multi-phase power conversion, electronic power distribution systems, modeling and control, and multi-disciplinary design optimization. He has advised over 40 PhD and 40 MS students to graduation and has co-authored over 700 papers.

Boroyevich was the president of the IEEE Power Electronics Society (PELS) from 2011-2012. He is a Fellow of IEEE and recipient of numerous awards, including the IEEE William E. Newell Power Electronics Technical Field Award, the IEEE PELS Harry A. Owen Distinguished Service Award, the European Power Electronics Association (EPE) Outstanding Achievement Award, and the Award for Outstanding Achievements and Service to Profession by the European Power Electronics and Motion Control Council. He is an Honorary Professor at the Xi’an Jiaotong University in Xi’an, China, and received the K.T. Li Chair Professor Award at the National Cheng Kung University, in Tainan, Taiwan. Boroyevich was elected to the US National Academy of Engineering in 2014 for advancements in control, modeling and design of electronic power conversion for electric energy and transportation.


Please visit for more information on the Distinguished Lecture Series and other Jonsson School events.

We look forward to seeing everyone in the TI Auditorium!

(Refreshments at 10:45 AM)


Adaptive Trimming and Testing of Analog/RF Integrated Circuits (ICs) by Professor Yiorgos Makris (UTD) Friday, Jan 25
(1 p.m. - 2 p.m.)


As devices scale down to smaller technology nodes, market goals such as high yield, high reliability and low cost become harder to attain. This is mainly due to the increased process variation and complexity involved in the manufacturing and testing of modern ICs. As a result, in recent years, adaptive testing and post-silicon calibration methods have been developed as solutions towards test cost reduction and performance improvement. While such methods have achieved better performance and yield, further improvements and cost reduction can be obtained by utilizing the full extent of available information across production stages of an IC and across ICs. To this end, this work proposes to investigate advanced adaptive testing and trimming solutions for analog/RF ICs by fully utilizing the information available from various IC manufacturing processes and at different granularity levels. Machine learning algorithms are used to extract correlations and enable optimization of test flow per lot, per wafer, per test touchdown, or per die, by making use of post-silicon measurements collected from all stages of the manufacturing and testing process. These machine learning-based solutions aim to achieve test cost reduction, as well as test quality enhancement, thereby enabling exploration of the cost-quality tradeoff.


Short Biography:

Yiorgos is a professor of Electrical and Computer Engineering at The University of Texas at Dallas, where he leads the Trusted and RELiable Architectures (TRELA) Research Laboratory. Prior to joining UT Dallas in 2011, he spent 10.5 years as a faculty of Electrical Engineering and of Computer Science at Yale University. He holds a Ph.D. (2001) and an M.S. (1997) in Computer Engineering from the University of California, San Diego, and a Diploma of Computer Engineering and Informatics (1995) from the University of Patras, Greece. His main research interests are in the application of machine learning and statistical analysis in the design of trusted and reliable integrated circuits and systems, with particular emphasis in the analog/RF domain. He is also investigating hardware-based malware detection, forensics and reliability methods in modern microprocessors, as well as on-die learning and novel computational modalities using emerging technologies. His research activities have been supported by NSF, ARO, AFRL, SRC, DARPA, Boeing, IBM, LSI, Intel, Advantest, AMS and TI. Yiorgos served as the 2016-2017 general chair and the 2013-2014 program chair of the IEEE VLSI Test Symposium, as well as the 2010-2012 program chair of the Test Technology Educational Program (TTEP). He has served as an associate editor of the IEEE Transactions on Information Forensics and Security, the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, the IEEE Design & Test periodical and the Springer Journal of Electronic Testing: Theory and Applications, and he has also served as a guest editor for the IEEE Transactions on Computers and the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, and as a topic coordinator and/or program committee member for several IEEE and ACM conferences. He is a Senior Member of the IEEE, a recipient of the 2006 Sheffield Distinguished Teaching Award, a recipient of Best Paper Awards from the 2013 Design Automation and Test in Europe (DATE'13) conference and the 2015 VLSI Test Symposium (VTS'15).