The Micro Imaging Lab contains a JEOL JSM-IT100 InTouchScope scanning electron microscope. The SEM is flexible and powerful, using secondary electron imaging to reveal very small surface topography, backscatter electron imaging to reveal phases with different mean atomic weight, and energy-dispersive X-Ray analysis of natural materials. The SEM is especially useful for studying regions that range in size from a millimeter to a micron or less.

Visit the Gallery for images obtained by the Micro Imaging Lab using the scanning electron microscope.